@article{adc,
  title = {Automatic Defect Classification Using Semi-Supervised Learning With Defect Localization},
  author = {Kim, Yusung and Lee, Jin-Seop and Lee, Jee-Hyong},
  journal = {IEEE Transactions on Semiconductor Manufacturing},
  year = {2023},
  volume = {36},
  number = {3},
  pages = {476--485},
  doi = {10.1109/TSM.2023.3278036},
  url = {https://doi.org/10.1109/TSM.2023.3278036}
}